Dynamic release control policy for the semiconductor wafer fabrication lines
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Jongsoo | - |
dc.contributor.author | Leachman, Robert C. | - |
dc.contributor.author | Suh, Byungkyoo | - |
dc.date.accessioned | 2021-06-24T01:09:25Z | - |
dc.date.available | 2021-06-24T01:09:25Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 1996-12 | - |
dc.identifier.issn | 0160-5682 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/47044 | - |
dc.description.abstract | We propose a policy for controlling the release of raw wafers into semiconductor wafer fabrication lines. The proposed policy exploits up-to-date factory floor information gathered by tracking systems in order to calculate the timing and amount of new releases to minimize mean flow times and mean tardiness while maintaining the maximum output rates of the system. Extensive computer experiments show that the proposed policy results in at least 23.0 and 17.9% improvements on average in mean waiting time and mean tardiness respectively compared to existing release rules. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Palgrave Macmillan Ltd. | - |
dc.title | Dynamic release control policy for the semiconductor wafer fabrication lines | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Jongsoo | - |
dc.identifier.doi | 10.1057/palgrave.jors.0471209 | - |
dc.identifier.scopusid | 2-s2.0-0030407745 | - |
dc.identifier.wosid | A1996VY33000009 | - |
dc.identifier.bibliographicCitation | Journal of the Operational Research Society, v.47, no.12, pp.1516 - 1525 | - |
dc.relation.isPartOf | Journal of the Operational Research Society | - |
dc.citation.title | Journal of the Operational Research Society | - |
dc.citation.volume | 47 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 1516 | - |
dc.citation.endPage | 1525 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Business & Economics | - |
dc.relation.journalResearchArea | Operations Research & Management Science | - |
dc.relation.journalWebOfScienceCategory | Management | - |
dc.relation.journalWebOfScienceCategory | Operations Research & Management Science | - |
dc.subject.keywordAuthor | release control | - |
dc.subject.keywordAuthor | semiconductor fabrication | - |
dc.identifier.url | https://www.tandfonline.com/doi/abs/10.1057/jors.1996.195 | - |
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