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Application of comparison imaging ellipsometry to crystallization of indium oxide thin films
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 안일신 | - |
| dc.date.accessioned | 2021-06-22T11:05:37Z | - |
| dc.date.available | 2021-06-22T11:05:37Z | - |
| dc.date.created | 2020-12-17 | - |
| dc.date.issued | 2019-05-30 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/4920 | - |
| dc.publisher | ICSE committee | - |
| dc.title | Application of comparison imaging ellipsometry to crystallization of indium oxide thin films | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 안일신 | - |
| dc.identifier.bibliographicCitation | 8th International conference on spectroscopic ellipsometry | - |
| dc.relation.isPartOf | 8th International conference on spectroscopic ellipsometry | - |
| dc.citation.title | 8th International conference on spectroscopic ellipsometry | - |
| dc.citation.conferencePlace | Barcelona, Spain | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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