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Universal Method to Determine the Dynamic NBIS- and PBS-induced Instabilities on Self-aligned Coplanar InGaZnO Thin-film Transistors
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 오새룬터 | - |
| dc.date.accessioned | 2021-06-22T12:44:32Z | - |
| dc.date.available | 2021-06-22T12:44:32Z | - |
| dc.date.issued | 20180522 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/7598 | - |
| dc.title | Universal Method to Determine the Dynamic NBIS- and PBS-induced Instabilities on Self-aligned Coplanar InGaZnO Thin-film Transistors | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | SID Display Week International Symposium | - |
| dc.citation.conferencePlace | Los Angeles Convention Center, CA, USA | - |
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