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Cost effective test planning for system-on-chip manufacture
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Lee, Songjun
; Ambler, Anthony P.
Article
Issue Date
2006
Citation
AUTOTESTCON (Proceedings), pp.86 - 92
Publisher
Institute of Electrical and Electronics Engineers Inc.
1
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Author
Ambler, Anthony P.
1
Lee, Song Jun
1
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Cost effective test planning
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Cost effectiveness
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Economic analysis
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System-on-chip manufacture
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Systems analysis
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VLSI circuits
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2006
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English
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AUTOTESTCON (Proceedings)
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scopus
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