ArticleIssue Date2008CitationIEEE Transactions on Instrumentation and Measurement, v.57, no.2, pp 268 - 275PublisherInstitute of Electrical and Electronics Engineers
ArticleIssue Date2002CitationIEEE Transactions on Instrumentation and Measurement, v.51, no.2, pp 246 - 251PublisherInstitute of Electrical and Electronics Engineers