Jang, Tae Hwan; Kang, Dong Min; Kim, Seung Hun; Lee, Chae Jun; Jun, Seongbae; Park, Hyuncheol; Kim, Joon Hyung; Park, Chul Soon
ArticleIssue Date2021CitationIEEE Journal of Solid-State Circuits, v.56, no.6, pp 1697 - 1710PublisherInstitute of Electrical and Electronics Engineers