Wang, H. -B.; Kauppila, J. S.; Lilja, K.; Bounasser, M.; Chen, L.; Newton, M.; Li, Y. -Q.; Liu, R.; Bhuva, B. L.; Wen, S. -J., et al.
ArticleIssue Date2017CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.64, no.1, pp.367 - 373PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC