ArticleIssue Date2003CitationIEEE Transactions on Instrumentation and Measurement, v.52, no.6, pp 1787 - 1791PublisherInstitute of Electrical and Electronics Engineers
ArticleIssue Date2003CitationIEEE International Symposium on Industrial Electronics, v.I, pp 184 - 188PublisherInstitute of Electrical and Electronics Engineers Inc.