ArticleIssue Date2002CitationIEEE Transactions on Instrumentation and Measurement, v.51, no.2, pp 246 - 251PublisherInstitute of Electrical and Electronics Engineers
ArticleIssue Date2003CitationIEEE Transactions on Instrumentation and Measurement, v.52, no.6, pp 1787 - 1791PublisherInstitute of Electrical and Electronics Engineers