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21-4: Distinguished Paper: Experimental Decomposition of the Positive Bias Temperature Stress-induced Instability in Self-aligned Coplanar InGaZnO Thin-film Transistors and its Modeling based on the Multiple Stretched-exponential Functions
- Authors
- 오새룬터
- Issue Date
- 20170523
- Place
- Los Angeles Convention Center, Los Angeles, CA, USA
- Conference Name
- SID (Society for Information Display) International Symposium
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