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IEEE Transactions on Instrumentation and Measurement

Journal Title

  • IEEE Transactions on Instrumentation and Measurement

ISSN

  • E 1557-9662 | P 0018-9456 | 0018-9456 | 1557-9662

Publisher

  • Institute of Electrical and Electronics Engineers
  • IEEE

Listed on(Coverage)

JCR1997-2019
SJR1999-2019
CiteScore2011-2019
SCI2010-2019
SCIE2010-2021
CC2016-2021
SCOPUS2017-2020

Active

  • Active

    based on the information

    • SCOPUS:2020-10

Country

  • USA

Aime & Scopes

  • Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.

Homepage

Article List

1 - 10 out of 10 results.

SCIESCOPUS
Maximizing Localization Accuracy via Self-Configurable Ultrasonic Sensor Grouping Using Genetic ApproachGo to Link

Yoon, Jong-Wan; Park, Taejoon

ArticleIssue Date2016CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.65, no.7, pp.1518 - 1529PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A Delta-Sigma Modulator for Low-Power Analog Front Ends in Biomedical InstrumentationGo to Link

Yoon, Younghyun; Duan, Quanzhen; Yeo, Jaejin; Roh, Jeongjin; Kim, Jongjin; Kim, Dongwook

ArticleIssue Date2016CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.65, no.7, pp.1530 - 1539PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
An Input-Feedforward Multibit Adder-Less Delta-Sigma Modulator for Ultrasound Imaging SystemsGo to Link

Jung, Youngjae; Roh, Hyungdong; Roh, Jeongjin

ArticleIssue Date2013CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.62, no.8, pp.2215 - 2227PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage StressGo to Link

Bae, Jongsun; Baeg, Sanghyeon; Park, Sungju

ArticleIssue Date2012CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.61, no.12, pp.3259 - 3272PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A Bufferless Interface for Single-Ended ECM SensorsGo to Link

Choi, Youngkil; Roh, Hyungdong; Roh, Jeongjin

ArticleIssue Date2012CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.61, no.2, pp.513 - 520PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic SpecificationsGo to Link

Kim, Byoungho; Abraham, Jacob A.

ArticleIssue Date2011CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.60, no.6, pp.2014 - 2024PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A di/dt Compensation Technique in Delay Testing by Disconnecting Power PinsGo to Link

Baeg, Sanghyeon

ArticleIssue Date2009CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.58, no.10, pp.3450 - 3456PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential SignalingGo to Link

Baeg, Sanghyeon

ArticleIssue Date2009CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.58, no.8, pp.2544 - 2556PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A 99-dB DR Fourth-Order Delta-Sigma Modulator for 20-kHz Bandwidth Sensor ApplicationsGo to Link

Choi, Youngkil; Roh, Jeongjin; Roh, Hyungdong; Nam, Hyunseok; Lee, Songjun

ArticleIssue Date2009CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.58, no.7, pp.2264 - 2274PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Low-cost scan test for IEEE-1500-Based SoCGo to Link

Yi, Hyunbean; Song, Jaehoon; Park, Sungju

ArticleIssue Date2008CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.57, no.5, pp.1071 - 1078PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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