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Proceedings - International Symposium on Quality Electronic Design, ISQED

Journal Title

  • Proceedings - International Symposium on Quality Electronic Design, ISQED

ISSN

  • 1948-3287 | 1948-3295

Publisher

Listed on(Coverage)

SJR2001-2009;2013-2017;2019
SCOPUS2017

Active

  • NA

Article List

1 - 6 out of 6 results.

SCIESCOPUS
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerationsGo to Link

Jung, Changmin; Baeg, Sanghyeon; Wen, Shihie; Wong, Richard

ArticleIssue Date2011CitationProceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, pp.390 - 397PublisherIEEE
SCIESCOPUS
Modeling and analysis of III-V logic FETs for devices and circuits: Sub-22nm technology III-V SRAM cell designGo to Link

Oh, Saeroonter; Park, Jeongha; Wong, S. Simon; Wong, H.-S. Philip

ArticleIssue Date2010CitationProceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010, pp.342 - 346PublisherIEEE
SCIESCOPUS
Modeling and Analysis of III-V Logic FETs for Devices and Circuits: Sub-22nm Technology III-V SRAM Cell DesignGo to Link

Oh, Saeroonter; Park, Jeongha; Wong, S. Simon; Wong, H. -S. Philip

ArticleIssue Date2010CitationPROCEEDINGS OF THE ELEVENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2010), pp.342 - 346PublisherIEEE
OTHER
High-frequency-measurement-based frequency-variant transmission line characterization and circuit modeling for accurate signal integrity verificationGo to Link

Kim, Hyunsik; Eo, Yungseon

ArticleIssue Date2007CitationProceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007PublisherIEEE
OTHER
Non-Physical pseudo-wave-based modal decoupling technique of multi-coupled co-planar transmission lines with homogeneous dielectric mediaGo to Link

Shin, Seongkyun; Eo, Yungseon

ArticleIssue Date2006CitationISQEDPublisherIEEE
OTHER
Efficient signal integrity verification method of multi-coupled RLC interconnect lines with asynchronous circuit switchingGo to Link

Je, Taeyong; Eo, Yungseon

ArticleIssue Date2006CitationProceedings - International Symposium on Quality Electronic Design, ISQED, pp.419 - 424PublisherIEEE
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