ScholarWorks@Hanyang University ERICA Campus: Journal : Proceedings - International Symposium on Quality Electronic Design, ISQED

Proceedings - International Symposium on Quality Electronic Design, ISQED

Journal Title

Proceedings - International Symposium on Quality Electronic Design, ISQED

ISSN

1948-3287 | 1948-3295

Publisher

Listed on(Coverage)

SJR	2001-2009;2013-2017;2019
SCOPUS	2017

Active

Article List

1 - 1 out of 1 results.

SCIESCOPUS

Modeling and analysis of III-V logic FETs for devices and circuits: Sub-22nm technology III-V SRAM cell design Go to Link

Oh, Saeroonter; Park, Jeongha; Wong, S. Simon; Wong, H.-S. Philip

ArticleIssue Date2010CitationProceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010, pp.342 - 346PublisherIEEE

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