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Proceedings of the International Display Workshops
Journal Title
Proceedings of the International Display Workshops
ISSN
1883-2490
Publisher
Listed on
(Coverage)
SJR
2012-2015;2019
SCOPUS
2017
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NA
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SCOPUS
A study on degradation mechanism of flexible a-InGaZnO thin film transistor under repetitive bending stress using simulation
Han, Ki lim; Jeong, Hyun Jun; Kim, Beom su; Oh, Saeroonter; Park, Jin seong
Article
Issue Date
2018
Citation
Proceedings of the International Display Workshops, IDW 2018, v.1, pp 330 - 333
Publisher
International Display Workshops
1
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