ScholarWorks@Hanyang University ERICA Campus: Kim, Byoung ho

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Kim, Byoung ho (김병호)

COLLEGE OF ENGINEERING SCIENCES (SCHOOL OF ELECTRICAL ENGINEERING)

Research Area: 집적회로 및 시스템

Tel 031-400-5298
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mixedsignal testing:5||production test:4||manufacturing test:4||analogtodigital converter (ADC):3||builtin selftest (BIST):3||selfcalibration:2||alternative testing:2||digitaltoanalog converter (DAC):2||Analogtodigital converter (ADC):2||Inductors:1||Leakage inductance:1||Load flow:1||Loopback test:1||Mixedsignal circuit testing:1||Mixedsignal testing:1||Optical security and encryption:1||Photoncounting imaging:1||Power generation:1||Ptychography:1||Voltage control:1||Zero voltage switching:1||analogtodigital converter:1||builtinselftest (BIST):1||cascade of integrators with feedforward (CIFF):1||complimentary metaloxidesemiconductor (CMOS) image sensor (CIS):1||deltasigma (Delta Sigma) modulator:1||digitaltoanalog converter:1||digitaltoanalog converter (DAC):1||fault detection:1||harmonic measurement:1||instrumentation:1||key selftesting:1||leaky integrateandfire (IF) neurons:1||loopback test:1||memristor:1||multiport active bridge (MAB) converter:1||neural network:1||neuromorphic:1||pattern recognition:1||selfbias amplifier:1||selfhealing:1||selftesting:1||spiketimingdependent plasticity (STDP):1||tripleactivebridge (TAB) converter:1||ADC:1||zerovoltage switching (ZVS):1||Amplifier sharing:1||Analogtodigital converter:1||Bridge circuits:1||Coherent diffractive imaging:1||Complimentary metaloxidesemiconductor (CMOS) image sensor:1||DAC:1||Digitaltoanalog converter:1||Inductance:1||

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