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Jiao, W.; Atwal, G.; Polak, P.; Karlic, R.; Cuppen, E.; Al-Shahrour, F.; Atwal, G.; Bailey, P.J.; Biankin, A.V.; Boutros, P.C., et al.
Wang, J.; Qi, J.; Jeon, S.; Fu, X.
Shuai, S.; Abascal, F.; Amin, S.B.; Bader, G.D.; Bandopadhayay, P.; Barenboim, J.; Beroukhim, R.; Bertl, J.; Boroevich, K.A.; Brunak, S., et al.
Bhandari, V.; Li, C.H.; Bristow, R.G.; Boutros, P.C.; Aaltonen, L.A.; Abascal, F.; Abeshouse, A.; Aburatani, H.; Adams, D.J.; Agrawal, N., et al.
Fitchett, David; Butler, Javed; van de Borne, Philippe; Zinman, Bernard; Lachin, John M.; Wanner, Christoph; Woerle, Hans J.; Hantel, Stefan; George, Jyothis T.; Johansen, Odd Erik, et al.
Kaku, Kohei; Lee, Jisoo; Mattheus, Michaela; Kaspers, Stefan; George, Jyothis; Woerle, Hans-Juergen; Aizenberg, D.; Ulla, M.; Waitman, J.; De Loredo, L., et al.
Zinman, Bernard; Inzucchi, Silvio E.; Lachin, John M.; Wanner, Christoph; Fitchett, David; Kohler, Sven; Mattheus, Michaela; Biomath, Dipl; Woerle, Hans J.; Broedl, Uli C., et al.
Wanner, Christoph; Lachin, John M.; Inzucchi, Silvio E.; Fitchett, David; Mattheus, Michaela; George, Jyothis; Woerle, Hans J.; Broedl, Uli C.; von Eynatten, Maximilian; Zinman, Bernard, et al.
Wanner, Christoph; Heerspink, Hiddo J. L.; Zinman, Bernard; Inzucchi, Silvio E.; Koitka-Weber, Audrey; Mattheus, Michaela; Hantel, Stefan; Woerle, Hans-Juergen; Broedl, Uli C.; von Eynatten, Maximilian, et al.
Wanner, Christoph; Inzucchi, Silvio E.; Lachin, John M.; Fitchett, David; von Eynatten, Maximilian; Mattheus, Michaela; Johansen, Odd Erik; Woerle, Hans J.; Broedl, Uli C.; Zinman, Bernard, et al.
Zinman, Bernard; Inzucchi, Silvio E.; Wanner, Christoph; Hehnke, Uwe; George, Jyothis T.; Johansen, Odd Erik; Fitchett, David; Aizenberg, D.; Ulla, M.; Waitman, J., et al.
Zinman, Bernard; Wanner, Christoph; Lachin, John M.; Fitchett, David; Bluhmki, Erich; Hantel, Stefan; Mattheus, Michaela; Devins, Theresa; Johansen, Odd Erik; Woerle, Hans J., et al.
Sieverling, L.; Hong, C.; Koser, S.D.; Ginsbach, P.; Kleinheinz, K.; Hutter, B.; Braun, D.M.; Cortés-Ciriano, I.; Xi, R.; Kabbe, R., et al.
Fitchett, David; Zinman, Bernard; Wanner, Christoph; Lachin, John M.; Hantel, Stefan; Salsali, Afshin; Johansen, Odd Erik; Woerle, Hans J.; Broedl, Uli C.; Inzucchi, Silvio E., et al.
Wang, J.; Huie, P.; Dalal, R.; Lee, S.; Tan, G.; Lee, D.; Lavinksy, D.; Palanker, D.
Zhang, Y.; Chen, F.; Fonseca, N.A.; He, Y.; Fujita, M.; Nakagawa, H.; Zhang, Z.; Brazma, A.; Amin, S.B.; Awadalla, P., et al.
Wang, J.; Shi, Y.; Wang, M.; Park, B.; Peng, M.Y.-P.; Deng, N.
Cmero, M.; Yuan, K.; Ong, C.S.; Schröder, J.; Adams, D.J.; Anur, P.; Beroukhim, R.; Boutros, P.C.; Bowtell, D.D.L.; Campbell, P.J., et al.
Verma, Subodh; Wanner, Christoph; Zwiener, Isabella; Ofstad, Anne Pernille; George, Jyothis T.; Fitchett, David; Zinman, Bernard; Aizenberg, D.; Ulla, M.; Waitman, J., et al.
Paczkowska, M.; Barenboim, J.; Sintupisut, N.; Fox, N.S.; Zhu, H.; Abd-Rabbo, D.; Mee, M.W.; Boutros, P.C.; Abascal, F.; Amin, S.B., et al.
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