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Heteromaterial Gate Tunneling Field-Effect Transistor for High-Speed and Radio-Frequency Applications

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dc.contributor.authorYoon, Young Jun-
dc.contributor.authorSeo, Jae Hwa-
dc.contributor.authorCho, Eou-Sik-
dc.contributor.authorLee, Jung-Hee-
dc.contributor.authorBae, Jin-Hyuk-
dc.contributor.authorCho, Seongjae-
dc.contributor.authorKang, In Man-
dc.date.available2020-02-28T15:45:11Z-
dc.date.created2020-02-06-
dc.date.issued2014-11-
dc.identifier.issn1533-4880-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/12145-
dc.description.abstractWe propose a tunneling field-effect transistor (TFET) with a heteromaterial (HM)-gate not only for low standby power (LSTP) applications, which TFETs are genuinely suitable for, but also for highspeed performance by properly adjusting intrinsic gate capacitance (C-gg). As a result of simulations in this work, the HM-gate TFET showed better subthreshold characteristics (smaller S) at an appropriate threshold voltage (V-th) for LSTP applications, enhancing tunneling probability by modulating the difference in the metal workfunction (phi(m)) between the source-side gate (S-gate) and the drain-side gate (D-gate). Further, the C-gg of HM-gate TFET were extracted and compared against that of conventional TFETs having gates with various phi(m)'s. Since lower C-gg can be formed by high phi(m) in the D-gate, the HM-gate TFET has an excellent cut-off frequency (f(T)) and intrinsic delay time (tau) associated with the C-gg. We confirmed that the HM-gate TFET proposed in this work achieves superb performance for LSTP applications as well as high-frequency operations.-
dc.language영어-
dc.language.isoen-
dc.publisherAMER SCIENTIFIC PUBLISHERS-
dc.relation.isPartOfJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.titleHeteromaterial Gate Tunneling Field-Effect Transistor for High-Speed and Radio-Frequency Applications-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000344126500003-
dc.identifier.doi10.1166/jnn.2014.9882-
dc.identifier.bibliographicCitationJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.14, no.11, pp.8136 - 8140-
dc.identifier.scopusid2-s2.0-84908542447-
dc.citation.endPage8140-
dc.citation.startPage8136-
dc.citation.titleJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.citation.volume14-
dc.citation.number11-
dc.contributor.affiliatedAuthorCho, Eou-Sik-
dc.contributor.affiliatedAuthorCho, Seongjae-
dc.type.docTypeArticle-
dc.subject.keywordAuthorTunneling Field-Effect Transistor-
dc.subject.keywordAuthorLow Standby Power-
dc.subject.keywordAuthorRadio-Frequency-
dc.subject.keywordAuthorHeteromaterial Gate-
dc.subject.keywordAuthorHigh-Speed-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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Cho, Eou Sik
반도체대학 (반도체·전자공학부)
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