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Characteristics of Ga-Al Doped Zinc Oxide Thin Films Deposited by Facing Targets Sputtering

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dc.contributor.authorLee, Jin Seon-
dc.contributor.authorJung, Yu Sup-
dc.contributor.authorBark, Chung Wung-
dc.contributor.authorKim, Kyung Hwan-
dc.date.available2020-02-28T16:43:05Z-
dc.date.created2020-02-06-
dc.date.issued2014-09-02-
dc.identifier.issn1542-1406-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/12294-
dc.description.abstractGallium-aluminum doped zinc oxide (GAZO) thin film is evaluated as an alternative to ITO for use as transparent electrodes for display devices. GAZO transparent conducting thin films were deposited using a facing targets sputtering (FTS) system with a hetero-targets. The FTS system can generate high plasma density, suppress the bombardment of high-energy particles to the substrate, and reduce the working pressure and substrate temperature. The average transmittance achieved with these films was as high as 80% in the visible range. Using a working pressure of 0.4 Pa, the lowest resistivity achieved with the deposited film was 5.342 x 10(-4) omega center dot cm.-
dc.language영어-
dc.language.isoen-
dc.publisherTAYLOR & FRANCIS LTD-
dc.relation.isPartOfMOLECULAR CRYSTALS AND LIQUID CRYSTALS-
dc.subjectTRANSPARENT CONDUCTING OXIDES-
dc.subjectTHICKNESS DEPENDENCE-
dc.subjectZNO FILMS-
dc.subjectTEMPERATURE-
dc.subjectSYSTEM-
dc.titleCharacteristics of Ga-Al Doped Zinc Oxide Thin Films Deposited by Facing Targets Sputtering-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000345074100009-
dc.identifier.doi10.1080/15421406.2014.936772-
dc.identifier.bibliographicCitationMOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.600, no.1, pp.56 - 62-
dc.identifier.scopusid2-s2.0-84945187166-
dc.citation.endPage62-
dc.citation.startPage56-
dc.citation.titleMOLECULAR CRYSTALS AND LIQUID CRYSTALS-
dc.citation.volume600-
dc.citation.number1-
dc.contributor.affiliatedAuthorLee, Jin Seon-
dc.contributor.affiliatedAuthorJung, Yu Sup-
dc.contributor.affiliatedAuthorBark, Chung Wung-
dc.contributor.affiliatedAuthorKim, Kyung Hwan-
dc.type.docTypeArticle-
dc.subject.keywordAuthorthin film-
dc.subject.keywordAuthorGAZO-
dc.subject.keywordAuthorfacing target sputtering-
dc.subject.keywordAuthortransparent electrode-
dc.subject.keywordAuthorworking pressure-
dc.subject.keywordPlusTRANSPARENT CONDUCTING OXIDES-
dc.subject.keywordPlusTHICKNESS DEPENDENCE-
dc.subject.keywordPlusZNO FILMS-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusSYSTEM-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaCrystallography-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryCrystallography-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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