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PDP 효율 및 생산성 향상을 위한 공정단순화 기술

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dc.contributor.author권상직-
dc.date.available2020-02-29T02:46:17Z-
dc.date.created2020-02-12-
dc.date.issued2013-
dc.identifier.issn1738-2270-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/15497-
dc.description.abstractThis paper focuses on the fundamental issues for improving the efficiency and throughput of the AC PDP (Plasma Display Panel) manufacturing. The properties of the MgO protective layer affect the PDP efficiency. Especially, the secondary electron emission efficiency was affected on the deposition rate of MgO during the evaporation. In this study, the deposition rate of 5 Å/s has given the maximum efficiency value of 0.05 It is demonstrated that the impurity gases such as H2O, CO2, CO or N2, and O2 can be remained inside the PDP panel before sealing and the amount of the impurity gases decreased rapidly as the base vacuum level increased, especially near 10-5 torr. The fundamental solution in order to overcome these problems is the vacuum in-line sealing process from the MgO evaporation to the final sealing of the panel without breaking the vacuum. We have demonstrated this fundamental process technology and shown the feasibility. The firing voltage was reduced down to 285 V at the base vacuum value of 10-6 torr, whreras it was about 328 V at the base vacuum value of 10-3 torr.-
dc.language영어-
dc.language.isoen-
dc.publisher한국반도체디스플레이기술학회-
dc.relation.isPartOf반도체디스플레이기술학회지-
dc.titlePDP 효율 및 생산성 향상을 위한 공정단순화 기술-
dc.title.alternativeProcess TAC Time Reduction Technology for Improving the Efficiency and Throughput of the PDP-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass2-
dc.identifier.bibliographicCitation반도체디스플레이기술학회지, v.12, no.2, pp.45 - 50-
dc.identifier.kciidART001786669-
dc.citation.endPage50-
dc.citation.startPage45-
dc.citation.title반도체디스플레이기술학회지-
dc.citation.volume12-
dc.citation.number2-
dc.contributor.affiliatedAuthor권상직-
dc.subject.keywordAuthorPlasma display panel-
dc.subject.keywordAuthorMgO evaporation-
dc.subject.keywordAuthorVacuum sealing-
dc.subject.keywordAuthorHigh throughput-
dc.subject.keywordAuthorTAC time reduction-
dc.description.journalRegisteredClasskci-
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반도체대학 (반도체·전자공학부)
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