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Structural Effects on Unipolar Resistive Switching Behaviors in Oxide-Based RRAM for High-Density and Low-Power Applications
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조성재 | - |
| dc.date.available | 2020-04-24T07:36:36Z | - |
| dc.date.issued | 2015-07-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/28805 | - |
| dc.title | Structural Effects on Unipolar Resistive Switching Behaviors in Oxide-Based RRAM for High-Density and Low-Power Applications | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 30th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2015) | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | 대한민국 서울 | - |
| dc.citation.endPage | 236 | - |
| dc.citation.startPage | 235 | - |
| dc.citation.title | Proceedings of ITC-CSCC 2015 | - |
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Related Researcher
- Cho, Seong Jae
- IT (Major of Electronic Engineering)