온도에 의존하는 전기적 측정을 이용한 분자 메모리 소자의 전하 이동 메카니즘
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권상직 | - |
dc.date.available | 2020-04-24T19:39:58Z | - |
dc.date.issued | 2008-04-11 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/35594 | - |
dc.title | 온도에 의존하는 전기적 측정을 이용한 분자 메모리 소자의 전하 이동 메카니즘 | - |
dc.type | Conference | - |
dc.citation.conferenceName | 2008년도 한국전기전자재료학회 | - |
dc.citation.conferencePlace | 대한민국 | - |
dc.citation.conferencePlace | 서울 고려대 | - |
dc.citation.endPage | 18 | - |
dc.citation.startPage | 17 | - |
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