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First-principles study of interface defects in Si oxynitrideFirst-principles study of interface defects in Si oxynitride
- Alternative Title
- First-principles study of interface defects in Si oxynitride
- Authors
- 이은철
- Issue Date
- 10-Nov-2007
- Place
- 대한민국
AT center, 대한민국
- metadata.conference.dc.citation.conferenceName
- The International Conference of the Korean Ceramic Society for 50th Anniversary
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Collections - 바이오나노대학 > 나노물리학과 > 2. Conference Papers
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Related Researcher
- Lee, Eun Cheol
- BioNano Technology (Department of Physics)