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Focused Ion Beam-Based Fabrication and Electrical Impedance Characterization of Sub-Micropore Membrane

Authors
Kim, YuntaeChoi, YoonJeon, MinseokMin, JunhongCho, Sungbo
Issue Date
Nov-2016
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Hole; Impedance Spectroscopy; MEMS; Silicon Nitride; Single Cell
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.11, pp.11928 - 11932
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
16
Number
11
Start Page
11928
End Page
11932
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/7733
DOI
10.1166/jnn.2016.13619
ISSN
1533-4880
Abstract
Pore membranes have been used to entrap molecules, e.g., DNA, viruses, and proteins, and to mimic the lipid membrane of cells for studying various biological phenomena. In this work, sub-micropore membranes were fabricated by silicon processing along with the focused ion beam (FIB) technique and the electrical impedance of the fabricated pore membranes was characterized. Through scanning electron microscopy, the fabricated pore was found to have a diameter of 500 nm and thickness of 500 nm. Electrical impedance measurements of the pore membrane and cells revealed an increase in the impedance magnitude at low frequencies according to the positioning of single cells on the pore. Further, the measured impedance value of the pore membrane was found to be dependent on the type of cell positioned on the pore.
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반도체대학 (반도체·전자공학부)
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