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Chemical Doping Effects in Multilayer MoS2 and Its Application in Complementary Inverter

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dc.contributor.authorYoo, Hocheon-
dc.contributor.authorHong, Seongin-
dc.contributor.authorOn, Sungmin-
dc.contributor.authorAhn, Hyungju-
dc.contributor.authorLee, Han-Koo-
dc.contributor.authorHong, Young Ki-
dc.contributor.authorKim, Sunkook-
dc.contributor.authorKim, Jae-Joon-
dc.date.available2020-10-20T06:45:31Z-
dc.date.created2020-06-10-
dc.date.issued2018-07-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/78633-
dc.description.abstractMultilayer MoS2 has been gaining interest as a new semiconducting material for flexible displays, memory devices, chemical/biosensors, and photodetectors. However, conventional multilayer MoS2 devices have exhibited limited performances due to the Schottky barrier and defects. Here, we demonstrate poly(diketopyrrolopyrrole-terthiophene) (PDPP3T) doping effects in multilayer MoS2, which results in improved electrical characteristics (similar to 4.6X higher on current compared to the baseline and a high current on/off ratio of 106). Synchrotron-based study using X-ray photoelectron spectroscopy and grazing incidence wide-angle X-ray diffraction provides mechanisms that align the edge-on crystallites (97.5%) of the PDPP3T as well as a larger interaction with MoS2 that leads to dipole and charge transfer effects (at annealing temperature of 300 degrees C), which support the observed enhancement of the electrical characteristics. Furthermore, we demonstrate a complementary metal-oxide-semiconductor inverter that uses a p-type MoSe2 and a PDPP3T-doped MoS2 as charging and discharging channels, respectively.-
dc.language영어-
dc.language.isoen-
dc.publisherAMER CHEMICAL SOC-
dc.relation.isPartOfACS APPLIED MATERIALS & INTERFACES-
dc.titleChemical Doping Effects in Multilayer MoS2 and Its Application in Complementary Inverter-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000439007700043-
dc.identifier.doi10.1021/acsami.8b08773-
dc.identifier.bibliographicCitationACS APPLIED MATERIALS & INTERFACES, v.10, no.27, pp.23270 - 23276-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85048880453-
dc.citation.endPage23276-
dc.citation.startPage23270-
dc.citation.titleACS APPLIED MATERIALS & INTERFACES-
dc.citation.volume10-
dc.citation.number27-
dc.contributor.affiliatedAuthorYoo, Hocheon-
dc.contributor.affiliatedAuthorHong, Seongin-
dc.type.docTypeArticle-
dc.subject.keywordAuthortransition-metal dichalcogenides-
dc.subject.keywordAuthorthin-film transistor-
dc.subject.keywordAuthorchemical doping-
dc.subject.keywordAuthormultilayer MoS2-
dc.subject.keywordAuthorcomplementary inverter-
dc.subject.keywordPlusTRANSITION-METAL DICHALCOGENIDES-
dc.subject.keywordPlusCIRCUITS-
dc.subject.keywordPlusTRANSISTORS-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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반도체대학 (반도체·전자공학부)
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