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Chemical Doping Effects on CVD-Grown Multilayer MoSe2 Transistor

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dc.contributor.authorYoo, Hocheon-
dc.contributor.authorHong, Seongin-
dc.contributor.authorMoon, Hyunseong-
dc.contributor.authorOn, Sungmin-
dc.contributor.authorAhn, Hyungju-
dc.contributor.authorLee, Han-Koo-
dc.contributor.authorKim, Sunkook-
dc.contributor.authorHong, Young Ki-
dc.contributor.authorKim, Jae-Joon-
dc.date.available2020-10-20T06:45:34Z-
dc.date.created2020-06-10-
dc.date.issued2018-06-
dc.identifier.issn2199-160X-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/78636-
dc.description.abstractMultilayer transition metal dichalcogenides (TMDs) potentially provide opportunities for large-area electronics, including flexible displays and wearable sensors. However, most TMDs suffer from a Schottky barrier (SB) and nonuniform defects, which severely limit their electrical performances. Here, a novel chemical doping scheme is presented using poly-(diketopyrrolopyrrole-terthiophene) (PDPP3T) to compensate the defects and SB of multilayer molybdenum diselenide (MoSe2), exhibiting greatly enhanced electrical characteristics, including on-current (approximate to 2000-fold higher) and photoresponsivity (approximate to 10-fold larger) over the baseline MoSe2 device. Based on comprehensive analysis using X-ray photoelectron spectroscopy, grazing incidence wide-angle X-ray diffraction, atomic force microscopy, and near-edge X-ray absorption of fine structure, it is shown that two mechanisms (dipole-induced and charge-transfer doping effects) account for such enhancements in the multilayer MoSe2 device. The methodical generality of the strong n-doping behavior of multilayer MoSe2 is further demonstrated by applying thiophene instead of PDPP3T.-
dc.language영어-
dc.language.isoen-
dc.publisherWILEY-
dc.relation.isPartOfADVANCED ELECTRONIC MATERIALS-
dc.titleChemical Doping Effects on CVD-Grown Multilayer MoSe2 Transistor-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000434944500008-
dc.identifier.doi10.1002/aelm.201700639-
dc.identifier.bibliographicCitationADVANCED ELECTRONIC MATERIALS, v.4, no.6-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85045451522-
dc.citation.titleADVANCED ELECTRONIC MATERIALS-
dc.citation.volume4-
dc.citation.number6-
dc.contributor.affiliatedAuthorYoo, Hocheon-
dc.contributor.affiliatedAuthorHong, Seongin-
dc.type.docTypeArticle-
dc.subject.keywordAuthorchemical doping-
dc.subject.keywordAuthorhybrid devices-
dc.subject.keywordAuthorMoSe2-
dc.subject.keywordAuthormultilayer transition metal dichalcogenides (TMDs)-
dc.subject.keywordAuthorphototransistors-
dc.subject.keywordPlusLARGE-AREA-
dc.subject.keywordPlusHIGH-MOBILITY-
dc.subject.keywordPlusLAYER MOSE2-
dc.subject.keywordPlusMONOLAYER-
dc.subject.keywordPlusDISELENIDE-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusMOO3-
dc.subject.keywordPlusPOLYMERS-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusDONOR-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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