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Cited 4 time in webofscience Cited 4 time in scopus
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Exceptionally linear and highly sensitive photo-induced unipolar inverter device

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dc.contributor.authorNaqi, M.-
dc.contributor.authorLee, Ji Ye-
dc.contributor.authorLee, Byeong Hyeon-
dc.contributor.authorKim, Sunkook-
dc.contributor.authorLee, Sang Yeol-
dc.contributor.authorYoo, Hocheon-
dc.date.available2021-03-18T07:40:58Z-
dc.date.created2021-01-18-
dc.date.issued2021-01-
dc.identifier.issn2168-6734-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/80469-
dc.description.abstractOxide semiconductors are of particular interest in the field of integrated electronics due to their large-area fabrication, high uniformity, and superior performance. Here, we report an exceptionally sensitive photo-induced inverter device with high linearity based on the unipolar n-type channel material amorphous silicon indium zinc oxide (a-SIZO). The field-effect transistor (FET) based on a-SIZO exhibits maximum mobility of 9.8 cm2/Vs at VD of 5 V, high on/off ratio of 106, and stable threshold voltage (VTh) of -0.35 V. Additionally, the optical properties of the proposed FET include excellent VTh shift and photocurrent (Iphoto) with high linearity under various red-light illumination. The proposed enhancement-load type inverter device shows reliable electrical and optical characteristics with an inverter gain of 0.7 at VDD of 1 V and linear photo-response in terms of inverter gain and voltage shift, demonstrating promising potential in the field of integrated electronics for optoelectronic applications. CCBY-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOfIEEE Journal of the Electron Devices Society-
dc.titleExceptionally linear and highly sensitive photo-induced unipolar inverter device-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000622098400029-
dc.identifier.doi10.1109/JEDS.2020.3048725-
dc.identifier.bibliographicCitationIEEE Journal of the Electron Devices Society, v.9, pp.180 - 186-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85099087528-
dc.citation.endPage186-
dc.citation.startPage180-
dc.citation.titleIEEE Journal of the Electron Devices Society-
dc.citation.volume9-
dc.contributor.affiliatedAuthorLee, Sang Yeol-
dc.contributor.affiliatedAuthorYoo, Hocheon-
dc.type.docTypeArticle-
dc.subject.keywordAuthoramorphous silicon indium zinc oxide (a-SIZO)-
dc.subject.keywordAuthorElectrodes-
dc.subject.keywordAuthorField effect transistors-
dc.subject.keywordAuthorfield-effect transistor (FET)-
dc.subject.keywordAuthorInverters-
dc.subject.keywordAuthorLogic gates-
dc.subject.keywordAuthorOptical variables measurement-
dc.subject.keywordAuthorphoto-induced inverter.-
dc.subject.keywordAuthorphototransistor-
dc.subject.keywordAuthorPhototransistors-
dc.subject.keywordAuthorSemiconductor device measurement-
dc.subject.keywordAuthorUnipolar inverter-
dc.subject.keywordPlusAmorphous silicon-
dc.subject.keywordPlusBinary alloys-
dc.subject.keywordPlusField effect transistors-
dc.subject.keywordPlusII-VI semiconductors-
dc.subject.keywordPlusImage enhancement-
dc.subject.keywordPlusIndium compounds-
dc.subject.keywordPlusOptical properties-
dc.subject.keywordPlusOxide semiconductors-
dc.subject.keywordPlusPhotocurrents-
dc.subject.keywordPlusSilicon compounds-
dc.subject.keywordPlusThorium alloys-
dc.subject.keywordPlusThreshold voltage-
dc.subject.keywordPlusZinc oxide-
dc.subject.keywordPlusChannel materials-
dc.subject.keywordPlusHigh linearity-
dc.subject.keywordPlusHigh uniformity-
dc.subject.keywordPlusIndium zinc oxides-
dc.subject.keywordPlusIntegrated electronics-
dc.subject.keywordPlusOptical characteristics-
dc.subject.keywordPlusOptoelectronic applications-
dc.subject.keywordPlusPhotoresponses-
dc.subject.keywordPlusElectric inverters-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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반도체대학 (반도체·전자공학부)
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