Improved UV photodetector performance of NiO films by substitutional incorporation of Li
DC Field | Value | Language |
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dc.contributor.author | Yadav, P.V.K. | - |
dc.contributor.author | Ajitha, B. | - |
dc.contributor.author | Annapureddy, V. | - |
dc.contributor.author | Reddy, Y.A.K. | - |
dc.contributor.author | Sreedhar, A. | - |
dc.date.accessioned | 2021-07-23T03:40:10Z | - |
dc.date.available | 2021-07-23T03:40:10Z | - |
dc.date.created | 2021-07-19 | - |
dc.date.issued | 2021-10-15 | - |
dc.identifier.issn | 0167-577X | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/81734 | - |
dc.description.abstract | In this study, NiO and Li0.2Ni0.8O (LNO) thin films are successfully deposited by sputtering technique. X-ray photoelectron spectroscopy (XPS) analysis revealed the existence of Ni vacancies. Here, we fabricated metal-semiconductor-metal (M-S-M) structure for exploring the ultra-violet (UV) photodetector (PD) performance. The impact of interstitial oxygen and substitutional incorporation of monovalent Li+ ion in Ni2+ sites of NiO on UV photodetector performance are explored. In a word, LNO exhibited superior responsivity (0.218 A/W) and detectivity (0.467 × 1012 Jones) even at lower power density of 0.31 mW/cm2. © 2021 Elsevier B.V. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER | - |
dc.relation.isPartOf | Materials Letters | - |
dc.title | Improved UV photodetector performance of NiO films by substitutional incorporation of Li | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000672724800006 | - |
dc.identifier.doi | 10.1016/j.matlet.2021.130296 | - |
dc.identifier.bibliographicCitation | Materials Letters, v.301 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-85109527804 | - |
dc.citation.title | Materials Letters | - |
dc.citation.volume | 301 | - |
dc.contributor.affiliatedAuthor | Sreedhar, A. | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Detectivity | - |
dc.subject.keywordAuthor | Li incorporation | - |
dc.subject.keywordAuthor | NiO | - |
dc.subject.keywordAuthor | Photodetector | - |
dc.subject.keywordAuthor | Responsivity | - |
dc.subject.keywordPlus | Lithium | - |
dc.subject.keywordPlus | Photodetectors | - |
dc.subject.keywordPlus | Photoelectrons | - |
dc.subject.keywordPlus | Photons | - |
dc.subject.keywordPlus | X ray photoelectron spectroscopy | - |
dc.subject.keywordPlus | Detectivity | - |
dc.subject.keywordPlus | Li incorporation | - |
dc.subject.keywordPlus | Li$++$ | - |
dc.subject.keywordPlus | NiO films | - |
dc.subject.keywordPlus | Performance | - |
dc.subject.keywordPlus | Photodetector | - |
dc.subject.keywordPlus | Responsivity | - |
dc.subject.keywordPlus | Substitutional incorporation | - |
dc.subject.keywordPlus | Thin-films | - |
dc.subject.keywordPlus | Ultra-violet photodetectors | - |
dc.subject.keywordPlus | Nickel oxide | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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