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A Single-Supply CDAC-Based Buffer-Embedding SAR ADC With Skip-Reset Scheme Having Inherent Chopping Capability

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dc.contributor.authorSeo, Min-Jae-
dc.contributor.authorJin, Dong-Hwan-
dc.contributor.authorKim, Ye-Dam-
dc.contributor.authorKim, Jong-Pal-
dc.contributor.authorRyu, Seung-Tak-
dc.date.accessioned2022-03-07T05:40:12Z-
dc.date.available2022-03-07T05:40:12Z-
dc.date.created2022-03-06-
dc.date.issued2020-10-
dc.identifier.issn0018-9200-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/83649-
dc.description.abstractThis article presents a power-efficient buffer-embedding successive approximation register (SAR) analog-to-digital converter (ADC) that utilizes a core power supply for the source-follower buffer, having a rail-to-rail signal swing due to the capacitive-level shifting bias scheme. Also, to implement the switched-capacitor (SC) level-shifting bias scheme without bias leakage issue, a negative boosting circuit is proposed. The boosting circuit is designed without any reliability issue, even with the use of thin-oxide transistors. For low-power applications, such as the biomedical system and CMOS image sensor, the proposed ADC incorporates a skip-reset (SR) scheme, a low-power delta-readout method. In conjunction with 8x oversampling and the power-saving SR technique that has inherent chopping capability, a prototype SAR ADC fabricated in a 180-nm CMOS technology achieves a peak 74.8-dB signal-to-noise and distortion ratio (SNDR) and an 89.1-dB spurious free dynamic range (SFDR) for a 640-kHz bandwidth (BW) with an oversampling ratio (OSR) of 8, resulting in a Schreier figure of merit (FoM) of 167.3 dB. The chip area occupies 0.192 mm(2), and the power consumption is 180.1 mu W.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.titleA Single-Supply CDAC-Based Buffer-Embedding SAR ADC With Skip-Reset Scheme Having Inherent Chopping Capability-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000572629500004-
dc.identifier.doi10.1109/JSSC.2020.3006450-
dc.identifier.bibliographicCitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.55, no.10, pp.2660 - 2669-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85089372752-
dc.citation.endPage2669-
dc.citation.startPage2660-
dc.citation.titleIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.citation.volume55-
dc.citation.number10-
dc.contributor.affiliatedAuthorSeo, Min-Jae-
dc.type.docTypeArticle-
dc.subject.keywordAuthorAnalog-to-digital converter (ADC)-
dc.subject.keywordAuthorcapacitive-level shifting-
dc.subject.keywordAuthordelta (Delta) searching-
dc.subject.keywordAuthorloop-embedded input buffer-
dc.subject.keywordAuthorlow power-
dc.subject.keywordAuthorpush-pull source follower (SF)-
dc.subject.keywordAuthorskip-reset (SR)-
dc.subject.keywordAuthorsuccessive approximation register (SAR)-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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반도체대학 (반도체·전자공학부)
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