A 2.7-M Pixels 64-mW CMOS Image Sensor With Multicolumn-Parallel Noise-Shaping SAR ADCs
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hwang, Sun-Il | - |
dc.contributor.author | Chung, Jae-Hyun | - |
dc.contributor.author | Kim, Hyeon-June | - |
dc.contributor.author | Jang, Il-Hoon | - |
dc.contributor.author | Seo, Min-Jae | - |
dc.contributor.author | Cho, Sang-Hyun | - |
dc.contributor.author | Kang, Heewon | - |
dc.contributor.author | Kwon, Minho | - |
dc.contributor.author | Ryu, Seung-Tak | - |
dc.date.accessioned | 2022-03-07T05:40:35Z | - |
dc.date.available | 2022-03-07T05:40:35Z | - |
dc.date.created | 2022-03-06 | - |
dc.date.issued | 2018-03 | - |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/83656 | - |
dc.description.abstract | This paper presents a CMOS image sensor (CIS) utilizing a noise-shaping successive-approximation register analog-to-digital converter (SAR ADC) incorporating the delta-readout scheme. While the noise-shaping SAR ADC with a proposed two-tap passive finite-impulse response (FIR) filter improves effective resolution, the delta-readout scheme reduces its power consumption. A prototype 1920 x 1440 pixel CIS was fabricated in a 90-nm CIS process. A single-channel readout SAR ADC occupying an area of 22.4 mu mx 715 mu m was implemented for reading out 16 columns of pixel array, consuming 437 mu W. Owing to the proposed noise-shaping SAR ADC with oversampling ratio of 16, this paper achieves a noise reduction of 14 dB compared with the noise of a conventional SAR ADC. The delta-readout reduces the power consumption of the SAR ADC by 10% due to the high hit rate of the full high definition image format. The measured differential nonlinearity of the ADC is + 0.77/-0.54 LSB and the integral nonlinearity is + 0.81/-0.5 LSB. The prototype CIS consumes a total power of 64 mW and achieves a dynamic range of 66.5 dB and a figure of merit of 127 mu V.nJ at a data rate of 138 Mpixels/s. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.title | A 2.7-M Pixels 64-mW CMOS Image Sensor With Multicolumn-Parallel Noise-Shaping SAR ADCs | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000425996300045 | - |
dc.identifier.doi | 10.1109/TED.2018.2795005 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.3, pp.1119 - 1126 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-85041505555 | - |
dc.citation.endPage | 1126 | - |
dc.citation.startPage | 1119 | - |
dc.citation.title | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.citation.volume | 65 | - |
dc.citation.number | 3 | - |
dc.contributor.affiliatedAuthor | Seo, Min-Jae | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | CMOS image sensor (CIS) | - |
dc.subject.keywordAuthor | delta-readout scheme | - |
dc.subject.keywordAuthor | noise-shaping successive-approximation register analog-to-digital converter (SAR ADC) | - |
dc.subject.keywordAuthor | oversampling | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
1342, Seongnam-daero, Sujeong-gu, Seongnam-si, Gyeonggi-do, Republic of Korea(13120)031-750-5114
COPYRIGHT 2020 Gachon University All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.