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Cited 19 time in webofscience Cited 20 time in scopus
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Normalized-Full-Scale-Referencing Digital-Domain Linearity Calibration for SAR ADC

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dc.contributor.authorChang, Dong-Jin-
dc.contributor.authorKim, Wan-
dc.contributor.authorSeo, Min-Jae-
dc.contributor.authorHong, Hyeok-Ki-
dc.contributor.authorRyu, Seung-Tak-
dc.date.accessioned2022-03-07T05:40:41Z-
dc.date.available2022-03-07T05:40:41Z-
dc.date.created2022-03-06-
dc.date.issued2017-02-
dc.identifier.issn1549-8328-
dc.identifier.urihttps://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/83658-
dc.description.abstractThis paper proposes a linearity calibration algorithm of a capacitive digital-to-analog converter (CDAC) for successive approximation register (SAR) analog-to-digital converters (ADCs) based on a normalized-full-scale of the DAC. Since the capacitor weight errors are represented as the difference between the real and ideal weights with respect to the normalized-full-scale, the calibrated digital representation of CDAC does not have gain error. A model of a 14-bit-format SAR ADC with a segmented CDAC by a bridge capacitor is simulated to demonstrate the performance of the proposed calibration algorithm. The effective number of bits (ENOB) and spurious-free dynamic range (SFDR) of the 14-bit-format ADC model are improved to 13.2 bits and 94.0 dB from 8.4 bits and 54.8 dB, respectively, at a standard deviation of a unit capacitor of 2%. The gain-error-free characteristic of the proposed linearity calibration algorithm is verified with a 2-channel time-interleaved (TI) SAR ADC model.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS-
dc.titleNormalized-Full-Scale-Referencing Digital-Domain Linearity Calibration for SAR ADC-
dc.typeArticle-
dc.type.rimsART-
dc.description.journalClass1-
dc.identifier.wosid000395487900007-
dc.identifier.doi10.1109/TCSI.2016.2612692-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.64, no.2, pp.322 - 332-
dc.description.isOpenAccessN-
dc.identifier.scopusid2-s2.0-85010006397-
dc.citation.endPage332-
dc.citation.startPage322-
dc.citation.titleIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS-
dc.citation.volume64-
dc.citation.number2-
dc.contributor.affiliatedAuthorSeo, Min-Jae-
dc.type.docTypeArticle-
dc.subject.keywordAuthorCapacitor DAC-
dc.subject.keywordAuthorCDAC linearity calibration-
dc.subject.keywordAuthordigital calibration-
dc.subject.keywordAuthorfull-scale referring calibration-
dc.subject.keywordAuthorSAR ADC-
dc.subject.keywordAuthortime-interleaved ADC.-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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