The impact of improved non-local means denoising algorithm on photon-counting X-ray images using various Al additive filtrations
- Authors
- Lee, Seungwan; Lee, Youngjin
- Issue Date
- Mar-2022
- Publisher
- Elsevier
- Keywords
- Al filtration; Denoising algorithm; Improved non-local means (INLM) approach; Photon-counting X-ray imaging; Quantitative evaluation of image quality
- Citation
- Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, v.1027
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Volume
- 1027
- URI
- https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/84222
- DOI
- 10.1016/j.nima.2021.166244
- ISSN
- 0168-9002
- Abstract
- The filters used in X-ray systems affect the image quality and radiation dose. Although using filters has advantages in terms of image quality and dose, image noise increases because the amount of X-rays in the energy range of the entire area is reduced. Thus, a newly improved non-local means (INLM) denoising algorithm was modeled and applied to X-ray images based on the thickness of the aluminum (Al) filter, which is most commonly used in X-ray imaging systems, to prove its potential use. For X-ray image acquisition, a high-performance cadmium telluride material-based detector and a tube containing Al filters (1-, 3-, and 5-mm thickness) were designed. The proposed INLM denoising algorithm was modeled by including the improved weights for the gradient information for each pixel in the conventional NLM-based equation. When the proposed INLM denoising algorithm was applied to the acquired photon-counting X-ray images, results showed superior performance for both noise characteristics and no-reference-based image evaluation. In particular, we confirmed that when the INLM was applied to X-ray images using 5 mm Al thickness, noise characteristics and no-reference-based evaluation results were improved by approximately 1.36 times and 1.06 times, respectively, compared to the conventional NLM. The study proved that choosing the INLM in photon-counting X-ray images using 5 mm-thick Al filtration is vital for the success of image processing applications. © 2021 Elsevier B.V.
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