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Effect of Solvent Additives on Bulk Heterojunction Morphology of Organic Photovoltaics and Their Impact on Device Performance

Authors
Choi, Won TaeSong, JiyunKo, JongkukJang, YeongseonKim, Tae-HwanHan, Young-SooLim, JeewooLee, ChangheeChar, Kookheon
Issue Date
Jan-2016
Publisher
WILEY-BLACKWELL
Keywords
neutron scattering; additives; conducting polymers; Fullerenes; interpenetrating networks (IPN); small angle neutron scattering (SANS); P3HT:PCBM
Citation
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, v.54, no.2, pp.128 - 134
Journal Title
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
Volume
54
Number
2
Start Page
128
End Page
134
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/87579
DOI
10.1002/polb.23802
ISSN
0887-6266
Abstract
Morphology of the active layer in an organic photovoltaic (OPV) device is known to have a significant impact on the device performance. It is, however, difficult to characterize nanoscale morphologies in detail, especially at the ensemble level. Herein, we report the utilization of small angle neutron scattering (SANS) to investigate variations in the nanoscale morphologies of the active layer of poly(3-hexylthiophene-2,5-diyl):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) bulk heterojunction OPV depending on the composition of casting solvent. Both the power law and the poly hard sphere model were utilized to characterize the state of the donor and acceptor components, respectively, from the obtained SANS data. Furthermore, the relationship between the nanoscale morphology and device performance is outlined. It was found that the use of 2-chlorophenol, a poor solvent for P3HT and, at the same time, a very good solvent for PCBM, leads to nanomorphology featuring ordered, highly crystalline P3HT and small (15.2 nm) PCBM domains. (C) 2015 Wiley Periodicals, Inc.
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