Evolution of Low Symmetric Phase in Strained Epitaxial (Ba0.5, Sr0.5)TiO3 Thin Films Grown on Si
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jun, Sungjin | - |
dc.contributor.author | Eom, Ki Tae | - |
dc.contributor.author | Yang, Cheol-Woong | - |
dc.contributor.author | Kim, Sang Sub | - |
dc.contributor.author | Lee, Jaichan | - |
dc.date.accessioned | 2023-12-15T15:09:24Z | - |
dc.date.available | 2023-12-15T15:09:24Z | - |
dc.date.issued | 2015-08 | - |
dc.identifier.issn | 1947-2935 | - |
dc.identifier.issn | 1947-2943 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/89546 | - |
dc.description.abstract | The evolution of low symmetric phases was investigated in epitaxial (Ba-0.5,Sr-0.5)TiO3 (BST) thin films grown on Si with yttria stabilized zirconia (YSZ). Paraelectric cubic BST thin films, when exposed to tensile strain primarily due to Si, present low symmetric phases, tetragonal c and monoclinic r phases, depending on the thickness of the BST thin films. When BST films are thin (<80 nm), BST thin layers are in a mixed state of r and c phases. As the thickness of the BST layers further increases, the c phase rapidly disappears, and the monoclinic r phase becomes predominant. These strained BST thin films exhibit non-zero polarization and manifest themselves by non-volatility in a metal-ferroelectric-insulator structure on Si, which is attributed to the non-cubic phases developed by strained BST thin films. | - |
dc.format.extent | 5 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | AMER SCIENTIFIC PUBLISHERS | - |
dc.title | Evolution of Low Symmetric Phase in Strained Epitaxial (Ba0.5, Sr0.5)TiO3 Thin Films Grown on Si | - |
dc.type | Article | - |
dc.identifier.wosid | 000358269400013 | - |
dc.identifier.doi | 10.1166/sam.2015.2366 | - |
dc.identifier.bibliographicCitation | SCIENCE OF ADVANCED MATERIALS, v.7, no.8, pp 1510 - 1514 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.scopusid | 2-s2.0-84931846652 | - |
dc.citation.endPage | 1514 | - |
dc.citation.startPage | 1510 | - |
dc.citation.title | SCIENCE OF ADVANCED MATERIALS | - |
dc.citation.volume | 7 | - |
dc.citation.number | 8 | - |
dc.type.docType | Article | - |
dc.publisher.location | 미국 | - |
dc.subject.keywordAuthor | (Ba, Sr)TiO3 Thin Films | - |
dc.subject.keywordAuthor | Low Symmetry | - |
dc.subject.keywordAuthor | Strain | - |
dc.subject.keywordPlus | MISFIT RELAXATION MECHANISMS | - |
dc.subject.keywordPlus | DIELECTRIC-PROPERTIES | - |
dc.subject.keywordPlus | DOMAIN CONFIGURATIONS | - |
dc.subject.keywordPlus | FERROELECTRICITY | - |
dc.subject.keywordPlus | DIAGRAMS | - |
dc.subject.keywordPlus | STRESS | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
1342, Seongnam-daero, Sujeong-gu, Seongnam-si, Gyeonggi-do, Republic of Korea(13120)031-750-5114
COPYRIGHT 2020 Gachon University All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.