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Highly Reliable Magnetic Memory-Based Physical Unclonable Functions

Authors
Kang, JaiminHan, DonghyeonLee, KyungchulKo, SanKoh, DaekyuPark, ChandoAhn, JaesooYu, MinruiPakala, MahendraNoh, SujungLee, HansaemKwon, JoonHyunKim, Kab-JinPark, JongsunLee, SoogilLee, JisungPark, Byong-Guk
Issue Date
May-2024
Publisher
American Chemical Society
Keywords
magnetic random-access memory; physical unclonable function; reliability; magnetic tunnel junction; MRAM-PUF
Citation
ACS Nano, v.18, no.20, pp 12853 - 12860
Pages
8
Journal Title
ACS Nano
Volume
18
Number
20
Start Page
12853
End Page
12860
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/91364
DOI
10.1021/acsnano.4c00078
ISSN
1936-0851
1936-086X
Abstract
Magnetic random-access memory (MRAM), which stores information through control of the magnetization direction, offers promising features as a viable nonvolatile memory alternative, including high endurance and successful large-scale commercialization. Recently, MRAM applications have extended beyond traditional memories, finding utility in emerging computing architectures such as in-memory computing and probabilistic bits. In this work, we report highly reliable MRAM-based security devices, known as physical unclonable functions (PUFs), achieved by exploiting nanoscale perpendicular magnetic tunnel junctions (MTJs). By intentionally randomizing the magnetization direction of the antiferromagnetically coupled reference layer of the MTJs, we successfully create an MRAM-PUF. The proposed PUF shows ideal uniformity and uniqueness and, in particular, maintains performance over a wide temperature range from -40 to +150 degrees C. Moreover, rigorous testing with more than 1584 challenge-response pairs of 64 bits each confirms resilience against machine learning attacks. These results, combined with the merits of commercialized MRAM technology, would facilitate the implementation of MRAM-PUFs.
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반도체대학 (반도체·전자공학부)
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