ScholarWorks@Hanyang University

Browsing by Ahn, ByungDuAuthor

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 1 to 1 of 1

SCISCIESCOPUS
Origin of Electrical Instabilities in Self-Aligned Amorphous In-Ga-Zn-O Thin-Film TransistorsGo to Link

On, Nuri; Kang, Youngho; Song, Aeran; Ahn, ByungDu; Kim, Hye Dong; Lim, Jun Hyung; Chung, Kwun-Bum; Han, Seungwu; Jeong, Jae Kyeong

ArticleIssue Date2017CitationIEEE Transactions on Electron Devices, v.64, no.12, pp 4965 - 4973PublisherInstitute of Electrical and Electronics Engineers
1
CONTACT US

RSS_1.0 RSS_2.0 ATOM_1.0

222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366

COPYRIGHT © 2024 HANYANG UNIVERSITY.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어