Park, Ho-Ryul; Oh, Yun-Jai; Bae, Seok-Min; Choi, Seung-Cheol; Lim, Myung-Seop; Yoon, Young-Doo
ArticleIssue Date2025CitationIEEE Transactions on Industrial Electronics, v.72, no.3, pp 2347 - 2356PublisherInstitute of Electrical and Electronics Engineers