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Charge conversion effects of carbon nanotube network transistors by temperature for Al2O3 gate dielectric formationGo to Link

Kim, Un Jeong; Bin Son, Hyung; Lee, Eun Hong; Kim, Jong Min; Min, Shin Chul; Park, Wanjun

ArticleIssue Date2010CitationApplied Physics Letters, v.97, no.3, pp 1 - 3PublisherAmerican Institute of Physics
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