Lee, Cheol Ho; Chang, Dae-Sik; Oh, Byung-Hoon; Son, Jaebum; Kim, Yong Kyun
ArticleIssue Date2016Citation2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, v.2017, pp.1 - 3PublisherInstitute of Electrical and Electronics Engineers Inc.