Mun, Byung-June; Baek, Ji-Ho; Lee, Joun Ho; Kim, Byeong Koo; Choi, Hyun Chul; Kim, Jae-Hoon; Lee, Gi-Dong
ArticleIssue Date2013CitationIEEE Transactions on Electron Devices, v.60, no.10, pp 3430 - 3434PublisherInstitute of Electrical and Electronics Engineers