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Effect of processing temperature on the structural, electronic and electrical properties of solution-processed amorphous Ge-In-Sn-O thin-film transistorsGo to Link

Lim, Jun Hyung; Choi, Jun Hyuk; Lee, Seung Muk; Ahn, Byung Du; Chung, Kwun-Bum; Park, Jin-Seong; Hwang, Soo Min; Joo, Jinho

ArticleIssue Date2014CitationJournal of Physics D: Applied Physics, v.47, no.8, pp 1 - 7PublisherIOP Publishing Ltd.
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