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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Advanced Flattening Method for Scanned Atomic Force Microscopy ImagesGo to Link

Han, Cheolsu; Chung, Chung Choo

ArticleIssue Date2012CitationJournal of the Korean Physical Society, v.60, no.5, pp L680 - L683Publisher한국물리학회
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Automatic approaching method for atomic force microscope using a Gaussian laser beamGo to Link

Han, Cheolsu; Lee, Haiwon; Chung, Choo

ArticleIssue Date2009CitationReview of Scientific Instruments, v.80, no.7, pp 1 - 7PublisherAmerican Institute of Physics
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Feasibility of multi-walled carbon nanotube probes in AFM anodization lithographyGo to Link

Choi, Ji Sun; Bae, Sukiong; Ahn, Sang Jung; Kim, Dal Hyun; Jung, Ki Young; Han, Cheolsu; Chung, Chung Choo; Lee, Haiwon

ArticleIssue Date2007CitationUltramicroscopy, v.107, no.10-11, pp 1091 - 1094PublisherElsevier BV
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Line Patterning using a Scanning Probe Lithography Technique based on Convolution MethodGo to Link

Han, Cheolsu; Gwangmin, Kwon; Ahn, Sang Jung; Lee, Haiwon; Chung, Chung Choo

ArticleIssue Date2015CitationBulletin of the Korean Chemical Society, v.36, no.3, pp 1024 - 1031Publisher대한화학회
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Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopyGo to Link

Han, Cheolsu; Chung, Chung Choo

ArticleIssue Date2011CitationReview of Scientific Instruments, v.82, no.5, pp 1 - 8PublisherAmerican Institute of Physics
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