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Bias dependence of PBTI degradation mechanism in metal-oxide-semiconductor field effect transistors with La-incorporated hafnium-based dielectricGo to Link

Jang, Tae-Young; Kim, Dong-Hyoub; Kim, Jungwoo; Chang, Jun Suk; Jeong, Jae Kyeong; Heo, Yoon-Uk; Kim, Young-Ki; Choi, Changhwan; Park, Hokyung; Choi, Rino

ArticleIssue Date2011CitationMicroelectronic Engineering, v.88, no.7, pp 1373 - 1375PublisherElsevier BV
SCISCIESCOPUS
Effect of Al incorporation on the performance and reliability of p-type metal-oxide-semiconductor field effect transistorsGo to Link

Heo, Yoon-Uk; Jang, Tae-Young; Kim, Donghyup; Chang, Jun Suk; Manh Cuong Nguyen; Hasan, Musarrat; Yang, Hoichang; Jeong, Jae Kyeong; Choi, Rino; Choi, Changhwan

ArticleIssue Date2012CitationThin Solid Films, v.521, pp 119 - 122PublisherElsevier Sequoia
SCIESCOPUS
Everlasting Living and Breathing Gyroid 3D Network in Si@SiOx/C Nanoarchitecture for Lithium Ion BatteryGo to Link

Lee, Jaewoo; Moon, Janghyuk; Han, Sang A.; Kim, Junyoung; Malgras, Victor; Heo, Yoon-Uk; Kim, Hansu; Lee, Sang-Min; Liu, Hua Kun; Dou, Shi Xue, et al.

ArticleIssue Date2019CitationACS NANO, v.13, no.8, pp.9607 - 9619PublisherAMER CHEMICAL SOC
SCISCIESCOPUS
Si-Carbon Composite Nanofibers with Good scalability and Favorable Architecture for Highly Reversible Lithium Storage and Superb KineticsGo to Link

Lee, Youngmin; Heo, Yoon-Uk; Song, Dahye; Shin, Dong Wook; Kang, Yong-Mook

ArticleIssue Date2014CitationElectrochimica Acta, v.118, pp 100 - 105PublisherPergamon Press Ltd.
SCIESCOPUS
Supreme tensile properties in precipitation-hardened 316L stainless steel fabricated through powder cold-consolidation and annealing

Lee, Do Won; Asghari-Rad, Peyman; Heo, Yoon-Uk; Son, Sujung; Park, Hyojin; Lee, Ji-Su; Jang, Jae-il; Lee, Byeong-Joo; Kim, Hyoung Seop

ArticleIssue Date2024CitationMaterials Science and Engineering: A, v.893, pp 1 - 13PublisherElsevier BV
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