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Optimizing Reliability: Suppressing Wake-Up Effects in Morphotropic Phase Boundary-Engineered Hf x Zr1-x O2 FerroelectricsGo to Link

Han, Changhyeon; Kwak, Been; Choi, Joonhyeok; Jeong, Woojung; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2025CitationACS Applied Electronic Materials, v.7, no.13, pp 6027 - 6032PublisherAMER CHEMICAL SOC
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