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Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatmentGo to Link

Shin, Jae-won; Lee, Jeongyong; No, Young-soo; Jung, Jae-hun; Kim, Tae Whan; Choi, WK

ArticleIssue Date2007CitationApplied Physics Letters, v.90, no.18, pp 1 - 4PublisherAmerican Institute of Physics
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