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Recent review on improving mechanical durability for flexible oxide thin film transistorsGo to Link

Han, Ki-Lim; Jeong, Hyun-Jun; Kim, Beom-Su; Lee, Won-Bum; Park, Jin-Seong

ArticleIssue Date2019CitationJournal of Physics D: Applied Physics, v.52, no.48, pp 1 - 19PublisherIOP Publishing Ltd.
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Soft Recovery Process of Mechanically Degraded Flexible a-IGZO TFTs With Various Rolling Stresses and Defect Simulation Using TCAD SimulationGo to Link

Kim, Beom-Su; Jeong, Hyun-Jun; Han, Ki-Lim; Lee, Won-Bum; Kim, Yoon-Seo; Park, Jin-Seong

ArticleIssue Date2020CitationIEEE Transactions on Electron Devices, v.67, no.2, pp 535 - 541PublisherInstitute of Electrical and Electronics Engineers
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