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Effect of Al incorporation on the performance and reliability of p-type metal-oxide-semiconductor field effect transistorsGo to Link

Heo, Yoon-Uk; Jang, Tae-Young; Kim, Donghyup; Chang, Jun Suk; Manh Cuong Nguyen; Hasan, Musarrat; Yang, Hoichang; Jeong, Jae Kyeong; Choi, Rino; Choi, Changhwan

ArticleIssue Date2012CitationThin Solid Films, v.521, pp 119 - 122PublisherElsevier Sequoia
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