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Integrated noise modeling for image sensor using bayer domain imagesGo to Link

Baek, Yeul-Min; Kim, Joong-Geun; Cho, Dong-Chan; Lee, Jin-Aeon; Kim, Whoi Yul

ArticleIssue Date2009CitationLecture Notes in Computer Science, v.5496 LNCS, pp 413 - 424PublisherSpringer Verlag
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