Integrated noise modeling for image sensor using bayer domain images
- Authors
- Baek, Yeul-Min; Kim, Joong-Geun; Cho, Dong-Chan; Lee, Jin-Aeon; Kim, Whoi Yul
- Issue Date
- May-2009
- Publisher
- SPRINGER
- Citation
- Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), v.5496 LNCS, pp.413 - 424
- Indexed
- SCOPUS
- Journal Title
- Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
- Volume
- 5496 LNCS
- Start Page
- 413
- End Page
- 424
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/176802
- DOI
- 10.1007/978-3-642-01811-4_37
- ISSN
- 0302-9743
- Abstract
- Most of image processing algorithms assume that an image has an additive white Gaussian noise (AWGN). However, since the real noise is not AWGN, such algorithms are not effective with real images acquired by image sensors for digital camera. In this paper, we present an integrated noise model for image sensors that can handle shot noise, dark-current noise and fixedpattern noise together. In addition, unlike most noise modeling methods, parameters for the model do not need to be re-configured depending on input images once it is made. Thus the proposed noise model is best suitable for various imaging devices. We introduce two applications of our noise model: edge detection and noise reduction in image sensors. The experimental results show how effective our noise model is for both applications.
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