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SCIESCOPUS
Improved performance and stability of In-Sn-Zn-O thin film transistor by introducing a meso-crystalline ZrO2 high-k gate insulatorGo to Link

Choi, Wan-Ho; Sheng, Jiazhen; Jeong, Hyun-Jun; Park, Jin-Seong; Kim, MinJung; Jeon, Woojin

ArticleIssue Date2019CitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.37, no.2, pp.1 - 10PublisherA V S AMER INST PHYSICS
SCIESCOPUS
Review Article: Atomic layer deposition for oxide semiconductor thin film transistors: Advances in research and developmentGo to Linkopen access

Sheng, Jiazhen; Lee, Jung-Hoon; Choi, Wan-Ho; Hong, TaeHyun; Kim, MinJung; Park, Jin-Seong

ArticleIssue Date2018CitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.36, no.6PublisherA V S AMER INST PHYSICS
SCIESCOPUS
The impact of plasma-enhanced atomic layer deposited ZrSiOx insulators on low voltage operated In-Sn-Zn-O thin film transistorsGo to Link

Kim, MinJung; Jeong, Hyun-Jun; Sheng, Jiazhen; Choi, Wan-Ho; Jeon, Woojin; Park, Jin-Seong

ArticleIssue Date2019CitationCERAMICS INTERNATIONAL, v.45, no.15, pp.19166 - 19172PublisherELSEVIER SCI LTD
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