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Optoelectronic Characterization of Trap Density of States in Indium Gallium Oxide Thin-Film Transistors and Their Impact on Bias StabilityGo to Linkopen access

Kim, Sang Yeon; Lee, Je-Jun; Hur, Jae Seok; Kim, Buyeon; Hong, Jung Pyo; Han, Seong-Jun; Yeon, Eungseon; Kim, Jung Woo; Jeong, Jae Kyeong; Hwang, Do Kyung

ArticleIssue Date2026CitationACS APPLIED MATERIALS & INTERFACES, v.18, no.8, pp 13100 - 13110PublisherAMER CHEMICAL SOC
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