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Optimization for resistive reading probe of electric data storage system with a bit of 50 nmGo to Link

Choi, Jae-Hak; Chun, Yon-Do; Han, Pil-Wan; Kim, Sol; Kim, Youn-Hyun; Ahn, Joonseon; Kim, Yong-Su; Lee, Ju

ArticleIssue Date2008CitationInternational Journal of Applied Electromagnetics and Mechanics, v.28, no.1-2, pp 237 - 245PublisherIOS Press
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